A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
try to predict it using mathematical expressions. His heuristic model without mathematical proof is almost universally accepted. However, it entails a c- cuit specific noise factor that is not known a priori and so is not predictive. In this work, we attempt to address the topic of oscillator design from a diff- ent perspective. By introducing a new paradigm that accurately captures the subtleties of phase noise we try to answer the question: 'why do oscillators behave in a particular way?' and 'what can be done to build an optimum design?' It is also hoped that the paradigm is useful in other areas of circuit design such as frequency synthesis and clock recovery. In Chapter 1, a general introduction and motivation to the subject is presented. Chapter 2 summarizes the fundamentals of phase noise and timing jitter and discusses earlier works on oscillator's phase noise analysis. Chapter 3 and Chapter 4 analyze the physical mechanisms behind phase noise generation in current-biased and Colpitts oscillators. Chapter 5 discusses design trade-offs and new techniques in LC oscillator design that allows optimal design. Chapter 6 and Chapter 7 discuss a topic that is typically ignored in oscillator design. That is flicker noise in LC oscillators. Finally, Chapter 8 is dedicated to the complete analysis of the role of varactors both in tuning and AM-FM noise conversion.
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